Raghu N. Kackar (auth.), Khosrow Dehnad (eds.)'s Quality Control, Robust Design, and the Taguchi Method PDF

By Raghu N. Kackar (auth.), Khosrow Dehnad (eds.)

ISBN-10: 1468414720

ISBN-13: 9781468414721

ISBN-10: 1468414747

ISBN-13: 9781468414745

In 1980, I acquired a supply from Aoyama-gakuin collage to come back to the U.S. to aid American increase the standard in their items. In a small method this used to be to pay off the assistance the U.S. had given Japan after the conflict. in the summertime of 1980, I visited the AT&T Bell Laboratories caliber insurance middle, the association that based smooth qc. the results of my first summer season at AT&T used to be an test with an orthogonal array layout of dimension 18 (OA18) for optimization of an LSI fabrication method. As a degree of caliber, the volume "signal-ta-noise" ratio used to be to be optimized. considering the fact that then, this experi­ psychological procedure has been named "robust layout" and has attracted the eye of either engineers and statisticians. My colleagues at Bell Laboratories have written numerous expository articles and some theoretical papers on strong layout from the point of view of facts. simply because such a lot of humans have requested for copies of those papers, it's been made up our minds to put up them in a ebook shape. This anthology is the results of those efforts. even though caliber engineering borrows a few technical phrases from conventional layout of experiments, the ambitions of caliber engineering are diversified from these of statistics. for instance, think there are proprietors. One seller offers items whose caliber attribute has a typical distribution with the suggest on track (the wanted worth) and a undeniable ordinary deviation.

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Extra info for Quality Control, Robust Design, and the Taguchi Method

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For instance, if the nominal transistor gain is XI, the output voltage will have a much smaller variance. But the mean value YI associated with the transistor gain XI is far from the target value Yo. Now suppose there is another component in the circuit, such as a resistor, that has a linear effect on the output voltage and the circuit designer is at liberty to choose the nominal value of this component. The circuit designer can then adjust this component to move the mean value from YI to Yo. Adjustment of the mean value of a performance characteristic to its target value is usually a much easier engineering problem than the reduction of performance variation.

Five chips were selected from each wafer for making these measurements. These chips correspond to specific locations on a wafer-top, bottom, left, right and center. Thus for every experiment we have 10 readings for each of the three quality characteristics. 2 DATA ANALYSIS Both the pre-etch and the post-etch line widths are continuous variables. For each of these variables the statistics of interest are the mean and the standard deviation. The objective of our data analysis is to determine the factor level combination such that the standard deviation is minimum while keeping the mean on target.

In the 37 Overview decibel scale, the SIN ratio is defined as: . SIN ratio = 20 10810 [~ean) Standard De' . vlation = -20 10gto (coefficient of variation). In terms of the transformed variables, the optimization problem is to determine the optimum factor levels such that the SIN ratio is maximum while keeping the mean on target. This problem can be solved in two stages as follows: 1. Determine factors which have a Significant effect on the SIN ratio. This is done through the analysis of variance (ANOVA) of the SIN ratios.

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Quality Control, Robust Design, and the Taguchi Method by Raghu N. Kackar (auth.), Khosrow Dehnad (eds.)

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