Read e-book online Advances in Electronics and Electron Physics, Vol. 70 PDF

By Peter W. Hawkes (Ed.)

ISBN-10: 0120146703

ISBN-13: 9780120146703

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Extra resources for Advances in Electronics and Electron Physics, Vol. 70

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23 are similar and clearly indicate a local maximum of the tunneling conductivity in the middle of the junction. The deviation in the signal shape of the line scans in image (a) from that in the other two images apparently results from the influence of the phase-difference function Cp(x, y) (see Eq. A local conductivity maximum in the tunneling window such as shown in Fig. 23 eventually can lead to the development of a hotspot in the junction (Gross, Koyanagi, Seifert and Huebener, 1984). A particularly drastic and important case of an inhomogeneity in the tunneling barrier is the existence of a superconducting microshort between both electrodes of the junction.

Typical results are shown in Fig. 33. Here the dynamic thermal healing length qw found experimentally from the width of the signal peaks 6 V ( x ,y ) at the hotspot boundaries is plotted versus the frequency v of the beam modulation. The solid line represents a theoretical curve calculated from Eq. (21) R. P. 33. Dynamic thermal healing length qo versus the frequency v = 4271 of the beam modulation. Crosses: experimental values obtained from the width of the voltage peaks. Solid line: theoretical curve calculated from Eq.

On the other hand, for low phonon trapping, where the beam generated nonequilibrium SCANNING ELECTRON MICROSCOPY AT VERY LOW TEMPERATURES 33 phonons leave the superconducting electrode films rapidly, the spatial resolution is limited by the quasiparticle diffusion length. It appears that the first case is valid for most junction materials. The second case, which has not been studied in LTSEM experiments up to now, can arise for A1 as the material of the junction electrodes (Gross and Koyanagi, 1985).

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Advances in Electronics and Electron Physics, Vol. 70 by Peter W. Hawkes (Ed.)


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